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Synopsys DFT MAX scan compression


Ralf Jurrien : 2007-01-24 23:07:00
Synopsys DFT MAX scan compression : Synopsys, a leader in semiconductor design software, announced that Oki Electric Industry Co., Ltd. has adopted the Synopsys DFT MAX scan compression automation solution to enable higher test quality for its digital designs. DFT MAX implements compression on-chip that results in significantly less data required for each test pattern. Using DFT MAX, Oki was able to apply comprehensive at-speed testing in addition to its regular tests to improve the quality of volume testing without having to increase the memory capacity of its testers. Using DFT MAX requires no expertise in test compression techniques. Its gates-only adaptive scan architecture is the most area-efficient solution available.






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